Passivation of III-V semiconductor surfaces by plasma nitridation
Patent
·
OSTI ID:6367548
Type III-V compound semiconductor surfaces are passivated by exposure to a low pressure nitrogen plasma. The III element forms III element-nitride. Nitridation is performed in two steps; the first being at a low temperature to prevent decomposition of the surface by loss of V element, and the second step being performed at an elevated temperature at which nitridation proceeds at a faster rate. The resultant articles have a III element-nitride surface layer which protects the articles from environmental degradation while reducing the surface state density and permitting inversion of the surface layer.
- Assignee:
- United Technologies Corporation
- Patent Number(s):
- US 4448633
- OSTI ID:
- 6367548
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360601* -- Other Materials-- Preparation & Manufacture
42 ENGINEERING
420800 -- Engineering-- Electronic Circuits & Devices-- (-1989)
ARSENIC COMPOUNDS
ARSENIDES
CHEMICAL REACTIONS
DEPOSITION
ELEMENTS
FABRICATION
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
MATERIALS
NITRIDATION
NITROGEN
NONMETALS
PASSIVATION
PLASMA
PNICTIDES
SEMICONDUCTOR DEVICES
SEMICONDUCTOR MATERIALS
SURFACE AREA
SURFACE PROPERTIES
360601* -- Other Materials-- Preparation & Manufacture
42 ENGINEERING
420800 -- Engineering-- Electronic Circuits & Devices-- (-1989)
ARSENIC COMPOUNDS
ARSENIDES
CHEMICAL REACTIONS
DEPOSITION
ELEMENTS
FABRICATION
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
MATERIALS
NITRIDATION
NITROGEN
NONMETALS
PASSIVATION
PLASMA
PNICTIDES
SEMICONDUCTOR DEVICES
SEMICONDUCTOR MATERIALS
SURFACE AREA
SURFACE PROPERTIES