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Fabrication and lasing characteristics of 1. 3-. mu. m InGaAsP multiquantum-well lasers

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.336832· OSTI ID:6346221
This paper reports the fabrication and lasing characteristics of 1.3-..mu..m InGaAsP multiquantum-well (MQW) buried heterostructure (BH) lasers grown by liquid-phase epitaxy (LPE) technique. The MQW active region consists of five InGaAsP well layers (lambda/sub g/ = 1.3-..mu..m, L/sub z/approx.200 A and InGaAsP barrier layers (lambda/sub g/ = 1.1 ..mu..m, dapprox.400--600 A). These lasers have threshold currents of 15--20 mA at 25 /sup 0/C, external quantum efficiencies of 50% at 25 /sup 0/C, and T/sub 0/ values of 130--145 /sup 0/K in the temperature range of less than 300 /sup 0/K. The beam divergences perpendicular and parallel to the junction plane were in the narrow range of 10--13/sup 0/. Furthermore, the polarization-dependent gain-current relationship between the TE and TM mode of InGaAsP MQW lasers has been investigated in detail for the first time.
Research Organization:
Central Research Laboratory, Matsushita Electric Industrial Co., Ltd., Yagumo Nakamachi 3-15, Moriguchi-shi, Osaka 570, Japan
OSTI ID:
6346221
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 59:1; ISSN JAPIA
Country of Publication:
United States
Language:
English