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Growth and properties of InP-Ga/sub x/In/sub 1-x/As/sub y/P/sub 1-y/

Journal Article · · Inorg. Mater. (Engl. Transl.); (United States)
OSTI ID:6336146
Epitaxial layers of the Ga-In-As-P system were grown by zone recrystallization in a temperature gradient (ZRTG) method with a solid feed. The composition of the epitaxial layers was measured using local x-ray spectral analysis. Component diffusion during ZRTG was theoretically calculated in the isothermal approximation taking into account the dependence of component diffusion coefficients on their concentration in the liquid phase. Theoretical analysis agrees adequately with experimental data on the component distribution in Ga/sub x/In/sub 1x/As/sub y/P/sub 1-y/ layers obtained by zone recrystallization in a temperature gradient method. This confirms the suitability of component distribution coefficients extracted from measurements on homogeneous Ga/sub x/In/sub 1-x/As/sub y/P/sub 1-y/ layers to distribution calculations. Dislocation density concentration in Ga/sub x/In/sub 1-x/As/sub y/P/sub 1-y/ layers depends mainly on the composition, zone thickness and temperature of zone recrystallization in a temperature gradient.
Research Organization:
S. Ordzhonikidze Novocherkassk Polytechnic Institute (USSR)
OSTI ID:
6336146
Journal Information:
Inorg. Mater. (Engl. Transl.); (United States), Journal Name: Inorg. Mater. (Engl. Transl.); (United States) Vol. 24:2; ISSN INOMA
Country of Publication:
United States
Language:
English