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Use of PuBe source to simulate neutron-induced single event upsets in static RAMS

Conference · · IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:6284026

Neutron induced single event upsets were measured in static memory devices using a 10 curie PuBe source. The PuBe source conservatively overestimates the spectrum of fast neutrons emitted by a radioisotope thermoelectric generator (RTG). For the 93L422, the neutron-induced upset rate compared favorably with calculated values derived using the burst generation concept. By accounting for the production of the ionizing particles by the PuBe and RTG neutron spectra, convenient upper bound SEU upset rates for memory devices near an RTG can be derived.

Research Organization:
Boeing Aerospace Co., Seattle, WA (US)
OSTI ID:
6284026
Report Number(s):
CONF-880730-
Journal Information:
IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. 35:6; ISSN IETNA
Country of Publication:
United States
Language:
English

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