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Incorporation of ENDF-V neutron cross section data for calculating neutron-induced single event upsets

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA)
OSTI ID:6948193
;  [1]
  1. Boeing Aerospace and Electronics, Seattle, WA (US)
+ Show Author Affiliations

The burst generation rate method of calculating neutron-induced SEUs due to recoils has been expanded to utilize all relevant ENDF-V neutron cross section data for silicon. This enables more accurate calculation of the production rate of SEUs. This analysis method, when applied to upset rates in the 93L422 SRAM by neutrons in the upper atmosphere, gives approximately 3 {times} 10{sup 6} upset/bit-day, while earlier methods give a rate twice as large at higher altitudes.

OSTI ID:
6948193
Report Number(s):
CONF-890723--
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) Vol. 36:6; ISSN 0018-9499; ISSN IETNA
Country of Publication:
United States
Language:
English

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Related Subjects

42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
654003 -- Radiation & Shielding Physics-- Neutron Interactions with Matter
73 NUCLEAR PHYSICS AND RADIATION PHYSICS
BARYONS
CALCULATION METHODS
CROSS SECTIONS
EARTH ATMOSPHERE
ELECTRONIC CIRCUITS
ELEMENTARY PARTICLES
FERMIONS
HADRONS
HARDENING
INTEGRATED CIRCUITS
MEMORY DEVICES
MICROELECTRONIC CIRCUITS
NEUTRAL-PARTICLE TRANSPORT
NEUTRON TRANSPORT
NEUTRONS
NUCLEONS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
RADIATION TRANSPORT
STRATOSPHERE