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Comparison study of the five transistor-transistor-logic (TTL) families and emitter coupled logic (ECL). Final report

Technical Report ·
OSTI ID:6139440

This report describes the radiation test response of the five transistor-transistor-logic (TTL) technologies and the emitter-coupled-logic (ECL) technology. The five TTL technologies evaluated were Standard, High Speed, Low Power, Low Power Schottky, and Schottky. Quad dual input NAND (TTL) or NOR (ECL) gates and dual D flip-flops from each technology were tested. The devices were characterized for gamma dose-rate logic upset, total gamma dose survivability, and neutron fluence survivability. The data has been analyzed to provide a comparison of each logic technology's radiation response. (Author)

Research Organization:
Air Force Weapons Lab., Kirtland AFB, NM (USA)
OSTI ID:
6139440
Report Number(s):
AD-A-058093
Country of Publication:
United States
Language:
English

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Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COMPARATIVE EVALUATIONS
ELECTROMAGNETIC RADIATION
ELECTRONIC CIRCUITS
GAMMA RADIATION
IONIZING RADIATIONS
LOGIC CIRCUITS
NEUTRON FLUENCE
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATIONS