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Mixed-metal-oxide planar optical waveguides

Journal Article · · J. Vac. Sci. Technol., A; (United States)
DOI:https://doi.org/10.1116/1.576272· OSTI ID:6115190
Thin films of ZrO/sub 2/--SiO/sub 2/ were deposited by reactive magnetron sputtering and reactive ion beam sputter deposition. The films were fabricated into planar optical waveguides by either ion beam milling or using liftoff lithography. The indices of refraction of the mixed-oxide films were found to be approximately a linear function of composition and were varied from 2.15 to 1.67. The films with >12% SiO/sub 2/ were amorphous and thermally stable to at least 500 /sup 0/C. Optical loss measurements on films with high ZrO/sub 2/ content indicated losses of 3 to 4 dB/cm.
Research Organization:
IBM Research Division, T. J. Watson Research Center, Yorktown Heights, New York 10598
OSTI ID:
6115190
Journal Information:
J. Vac. Sci. Technol., A; (United States), Journal Name: J. Vac. Sci. Technol., A; (United States) Vol. 7:3; ISSN JVTAD
Country of Publication:
United States
Language:
English