Fundamental studies of grain boundary structure and properties in ICB aluminum

Conference · Mon May 01 04:00:00 EDT 1989

OSTI ID:6100437

Westmacott, K. H.; Dahmen, U.

Thin films prepared by the Ionized-Cluster-Beam (ICB) technique, pioneered at Kyoto University, are of great interest for both their fundamental structure and properties and their potential for practical applications. At Berkeley a research program has been initiated, in collaboration with professor Yamada and his colleagues at Kyoto University, to investigate a different aspect of ICB films. We are exploiting the unique bicrystal microstructure that forms with some thin film/substrate combinations to conduct a fundamental investigation of grain boundary structure and properties. Initially, the studies are being carried out on aluminum bicrystal films formed by deposition on a /100/ silicon single crystal substrate. Two types of transmission electron microscopy (TEM) experiments will be reported. High resolution imaging of specific grain boundary segments is performed on a second HVEM capable of resolving the position of atom columns in the core regions of a grain boundary. Complementary information obtained by the two techniques is helping us to understand the structure and properties of grain boundaries as well as learn more about ICB thin films. In the final section of this paper, the results of preliminary high-resolution observations of silver clusters dispersed on a carbon grid are given. 10 refs., 8 figs.

• Research Organization: Lawrence Berkeley Lab., CA (USA)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 6100437
• Report Number(s): LBL-27187; CONF-8906157-2; ON: DE89014884
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360102* -- Metals & Alloys-- Structure & Phase Studies
656003 -- Condensed Matter Physics-- Interactions between Beams & Condensed Matter-- (1987-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALUMINIUM
ANNEALING
BEAMS
BICRYSTALS
CLUSTER BEAMS
CRYSTAL STRUCTURE
CRYSTALS
DEPOSITION
ELEMENTS
FILMS
GRAIN BOUNDARIES
HEAT TREATMENTS
MECHANICAL PROPERTIES
METALS
MICROSTRUCTURE
PHYSICAL PROPERTIES
POLYCRYSTALS
SEMIMETALS
SILICON
SUBSTRATES
THIN FILMS