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The effects of impurities on the diffusion length in amorphous silicon

Conference · · Conf. Rec. IEEE Photovoltaic Spec. Conf.; (United States)
OSTI ID:6075825
A variety of impurities were added to silicon films grown under identical conditions in a dc glow discharge. Both the diffusion length and the depletion width were measured by means of the surface photovoltage technique. Gases such as disiloxane and nitrogen caused significant decreases in both the diffusion length and the depletion width while the effects produced by gases such as CH/sub 4/, CF/sub 4/, and SiF/sub 4/ were much smaller. Gases such as CO and SiH/sub 2/Cl/sub 2/ caused some reduction in the diffusion length but had little effect on the depletion width. A simple model is used to predict the effect of the impurities on the conversion efficiency of amorphous silicon solar cells.
Research Organization:
Solarex Thin Film Division, Newtown, PA
OSTI ID:
6075825
Report Number(s):
CONF-840561-
Conference Information:
Journal Name: Conf. Rec. IEEE Photovoltaic Spec. Conf.; (United States)
Country of Publication:
United States
Language:
English