Skip to main content
OSTI.GOVU.S. Department of Energy Office of Scientific and Technical Information
U.S. Department of Energy
Office of Scientific and Technical Information
 

Diffusion length and collection width for the evaluation of a-Si

Conference · · Conf. Rec. IEEE Photovoltaic Spec. Conf.; (United States)
OSTI ID:5489784
;
Using the liquid Schottky contact, the surface photovoltage technique is applied to a variety of glow discharge a-Si:H films to measure collection width, diffusion length and depletion width. These measures are also seen to be a sensitive method for studying light-soak changes. Finally, estimates of the density of states at the Fermi level have been made.
Research Organization:
Solar Energy Research Institute, Golden, CO
DOE Contract Number:
AC02-77CH00178
OSTI ID:
5489784
Report Number(s):
CONF-820906-
Conference Information:
Journal Name: Conf. Rec. IEEE Photovoltaic Spec. Conf.; (United States)
Country of Publication:
United States
Language:
English

Similar Records

Diffusion length and collection width for the evaluation of a-Si
Technical Report · Wed Sep 01 00:00:00 EDT 1982 · OSTI ID:6748199
The effects of impurities on the diffusion length in amorphous silicon
Conference · Tue May 01 00:00:00 EDT 1984 · Conf. Rec. IEEE Photovoltaic Spec. Conf.; (United States) · OSTI ID:6075825
Collection length of holes in a-Si:H by surface photovoltage using a liquid Schottky barrier
Journal Article · Sun Feb 28 23:00:00 EST 1982 · Appl. Phys. Lett.; (United States) · OSTI ID:5737753

Related Subjects

14 SOLAR ENERGY
140501* -- Solar Energy Conversion-- Photovoltaic Conversion
DEPLETION LAYER
DIFFUSION LENGTH
DIMENSIONS
DIRECT ENERGY CONVERTERS
ELECTRIC DISCHARGES
ENERGY DENSITY
ENERGY LEVELS
EQUIPMENT
EVALUATION
FERMI LEVEL
FILMS
GLOW DISCHARGES
LAYERS
LENGTH
MEASURING METHODS
PHOTOELECTRIC CELLS
PHOTOELECTROMAGNETIC EFFECTS
PHOTOVOLTAIC CELLS
PHOTOVOLTAIC EFFECT
SCHOTTKY EFFECT
SILICON SOLAR CELLS
SOLAR CELLS
SOLAR COLLECTORS
SOLAR EQUIPMENT
WIDTH