Synthesis and properties of layered synthetic microstructure (LSM) dispersion elements for 62 eV (200A) to 1. 24 keV (10A) radiation. Final report
The opportunities offered by engineered synthetic multilayer dispersion elements for x-rays have been recognized since the earliest days of x-ray diffraction analysis. In this paper, application of sputter deposition technology to the synthesis of Layered Synthetic Microstructure (LSMs) of sufficient quality for use as x-ray dispersion elements is discussed. It will be shown that high efficiency, controllable bandwidth dispersion elements, with d spacings varying from 15 A to 180 A, may be synthesized onto both mechanically stiff and flexible substrates. Multilayer component materials include tungsten, niobium, molybdenum, titanium, vanadium, and silicon layers separated by carbon layers. Experimental observations of peak reflectivity in first order, integrated reflectivity in first order, and diffraction performance at selected photon energies in the range, 100 to 15,000 eV, will be reported and compared to theory.
- Research Organization:
- Stanford Univ., CA (USA). Dept. of Materials Science and Engineering
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 6071333
- Report Number(s):
- UCRL-15393; ON: DE82001671
- Country of Publication:
- United States
- Language:
- English
Similar Records
Synthetic multilayer x-ray dispersion elements for 200 A (62 eV) to 0. 62 A (20 keV) radiation. Final report
Layered synthetic microstructures for soft x-ray spectroscopy of magnetically confined plasmas (invited)
Determination of the x-ray anomalous dispersion of titanium made with a titanium-carbon layered synthetic microstructure
Technical Report
·
Mon Oct 31 23:00:00 EST 1983
·
OSTI ID:6462696
Layered synthetic microstructures for soft x-ray spectroscopy of magnetically confined plasmas (invited)
Journal Article
·
Mon Oct 01 00:00:00 EDT 1990
· Review of Scientific Instruments; (USA)
·
OSTI ID:6134701
Determination of the x-ray anomalous dispersion of titanium made with a titanium-carbon layered synthetic microstructure
Journal Article
·
Mon Oct 01 00:00:00 EDT 1984
· J. Opt. Soc. Am. B: Opt. Phys.; (United States)
·
OSTI ID:6369654
Related Subjects
36 MATERIALS SCIENCE
360101* -- Metals & Alloys-- Preparation & Fabrication
360102 -- Metals & Alloys-- Structure & Phase Studies
CARBON
COHERENT SCATTERING
CRYSTAL STRUCTURE
DATA
DEPOSITION
DIFFRACTION
ELEMENTS
EXPERIMENTAL DATA
FILMS
INFORMATION
LAYERS
METALS
MICROSTRUCTURE
MOLYBDENUM
NIOBIUM
NONMETALS
NUMERICAL DATA
REFRACTORY METALS
SCATTERING
SEMIMETALS
SILICON
SPUTTERING
TITANIUM
TRANSITION ELEMENTS
TUNGSTEN
VANADIUM
X-RAY DIFFRACTION
360101* -- Metals & Alloys-- Preparation & Fabrication
360102 -- Metals & Alloys-- Structure & Phase Studies
CARBON
COHERENT SCATTERING
CRYSTAL STRUCTURE
DATA
DEPOSITION
DIFFRACTION
ELEMENTS
EXPERIMENTAL DATA
FILMS
INFORMATION
LAYERS
METALS
MICROSTRUCTURE
MOLYBDENUM
NIOBIUM
NONMETALS
NUMERICAL DATA
REFRACTORY METALS
SCATTERING
SEMIMETALS
SILICON
SPUTTERING
TITANIUM
TRANSITION ELEMENTS
TUNGSTEN
VANADIUM
X-RAY DIFFRACTION