Layered synthetic microstructures for soft x-ray spectroscopy of magnetically confined plasmas (invited)

Journal Article · Mon Oct 01 04:00:00 EDT 1990 · Review of Scientific Instruments; (USA)

DOI:https://doi.org/10.1063/1.1141866· OSTI ID:6134701

Moos, W; Zwicker, A P; Regan, S P; Finkenthal, M ^[1]

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1. Johns Hopkins University, Physics and Astronomy Department, Baltimore, MD (USA)

With the recent advances in layered synthetic microstructure (LSM) technology, it is now possible to build a simple, high-throughput, near-normal incidence soft x-ray spectrometer as a diagnostic for magnetically confined plasmas. Such spectrometers could be used for radiative power loss measurements from intrinsic impurities, an impurity concentration monitor, or ion temperature measurements from Doppler broadening of high charge-state metallic impurities. LSMs have been developed as either flat or curved multilayer mirrors (MLMs) or as coatings for conventional gratings. Flat multilayer mirrors can have near-normal incidence reflectivities greater than 50% throughout the entire soft x-ray region with bandpasses that can be less than 4 A. Coated gratings are being developed that will combine the high soft x-ray reflectivity of the LSM with the high resolution of the grating. Specific applications of LSMs as dispersive elements will be discussed. As an example, LSM-based low-resolution spectra of both a laboratory and tokamak plasma will be presented.

• OSTI ID: 6134701
• Journal Information: Review of Scientific Instruments; (USA), Journal Name: Review of Scientific Instruments; (USA) Vol. 61:10; ISSN RSINA; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
700102* -- Fusion Energy-- Plasma Research-- Diagnostics
CLOSED PLASMA DEVICES
CONFINEMENT
DEPOSITION
DESIGN
ELECTROMAGNETIC RADIATION
GRATINGS
IMPURITIES
ION TEMPERATURE
IONIZING RADIATIONS
MEASURING INSTRUMENTS
MIRRORS
PLASMA CONFINEMENT
PLASMA DIAGNOSTICS
RADIATIONS
SOFT X RADIATION
SPECTROMETERS
SPECTROSCOPY
SURFACE COATING
THERMONUCLEAR DEVICES
TOKAMAK DEVICES
X RADIATION
X-RAY SPECTROMETERS
X-RAY SPECTROSCOPY