Synthetic multilayer x-ray dispersion elements for 200 A (62 eV) to 0. 62 A (20 keV) radiation. Final report

Technical Report · Tue Nov 01 00:00:00 EST 1983

DOI:https://doi.org/10.2172/6462696· OSTI ID:6462696

Barbee, Jr, T W

This final report concerns research performed at Stanford University on a program sponsored by the Department of Energy through Lawrence Livermore National Laboratory and the Regents of the University of California (Subcontract No. 2695501) entitled Synthetic Multilayer X-ray Dispersion Elements for 200 A (62 eV) to 0.62 A (20 keV) Radiation. The thrust of the research was to investigate the synthesis process parameter dependence of the nature of the interfaces between constituent adjacent layers, the uniformity of layers, and the reflectivity for light of wavelengths 0.62 A to 200 A of synthetic multilayer crystals. Additionally, device development was to be undertaken with emphasis on spectrum analyzing dispersion elements, high energy Kirkpatrick-Baez X-ray microscope mirrors, multi-keV (1 to 5 keV) X-ray applications, X-ray beam splitters and synthetic multilayers fabricated from adjoining elements in the periodic table.

• Research Organization: Stanford Univ., CA (USA). Dept. of Materials Science and Engineering
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 6462696
• Report Number(s): UCRL-15615; SU-DMS-84-R-1; ON: DE85000757
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
OPTICAL FILTERS
INTERFERENCE
LAMELLAE
EV RANGE 10-100
EV RANGE 100-1000
INTERFEROMETERS
KEV RANGE 01-10
KEV RANGE 10-100
OPTICAL PROPERTIES
X-RAY DIFFRACTION
COHERENT SCATTERING
DIFFRACTION
ENERGY RANGE
EV RANGE
FILTERS
KEV RANGE
MEASURING INSTRUMENTS
PHYSICAL PROPERTIES
SCATTERING
657005* - Theoretical Physics- Optics