Synthetic multilayer x-ray dispersion elements for 200 A (62 eV) to 0. 62 A (20 keV) radiation. Final report

Technical Report · Tue Nov 01 04:00:00 EST 1983

DOI:https://doi.org/10.2172/6462696· OSTI ID:6462696

Barbee, Jr, T W

This final report concerns research performed at Stanford University on a program sponsored by the Department of Energy through Lawrence Livermore National Laboratory and the Regents of the University of California (Subcontract No. 2695501) entitled Synthetic Multilayer X-ray Dispersion Elements for 200 A (62 eV) to 0.62 A (20 keV) Radiation. The thrust of the research was to investigate the synthesis process parameter dependence of the nature of the interfaces between constituent adjacent layers, the uniformity of layers, and the reflectivity for light of wavelengths 0.62 A to 200 A of synthetic multilayer crystals. Additionally, device development was to be undertaken with emphasis on spectrum analyzing dispersion elements, high energy Kirkpatrick-Baez X-ray microscope mirrors, multi-keV (1 to 5 keV) X-ray applications, X-ray beam splitters and synthetic multilayers fabricated from adjoining elements in the periodic table.

• Research Organization: Stanford Univ., CA (USA). Dept. of Materials Science and Engineering
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 6462696
• Report Number(s): UCRL-15615; SU-DMS-84-R-1; ON: DE85000757
• Country of Publication: United States
• Language: English

Related Subjects

657005* -- Theoretical Physics-- Optics
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
COHERENT SCATTERING
DIFFRACTION
ENERGY RANGE
EV RANGE
EV RANGE 10-100
EV RANGE 100-1000
FILTERS
INTERFERENCE
INTERFEROMETERS
KEV RANGE
KEV RANGE 01-10
KEV RANGE 10-100
LAMELLAE
MEASURING INSTRUMENTS
OPTICAL FILTERS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
SCATTERING
X-RAY DIFFRACTION