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Scanning tunneling and atomic force microscopy study of layered transition metal halides Nb[sub 3]X[sub 8] (X = Cl, Br, I)

Journal Article · · Journal of the American Chemical Society; (United States)
DOI:https://doi.org/10.1021/ja00059a053· OSTI ID:5989534
; ; ; ;  [1]; ;  [2]
  1. Albert-Ludwigs Universitaet, Freiburg (Germany)
  2. North Carolina State Univ., Raleigh (United States)
Niobium halides Nb[sub c]X[sub 8] (X = Cl, Br, I) are made up of layers of composition Nb[sub 3]X[sub 8], and the two surfaces (A and B) of their individual Nb[sub 3]X[sub 8] layers are not equivalent in atomic corrugations. The surfaces of these halides were examined by atomic force microscopy (AFM) and scanning tunneling microscopy (STM) to obtain atomic resolution images. For a given surface, AFM images differ significantly from STM images, and the resolution of the STM images depends on the tunneling conditions. The observed AFM and STM images were analyzed by calculating the total electron density distribution, [rho](r[sub 0]), and the partial electron density distribution, [rho](r[sub 0], e[sub f]), for the two surfaces of single Nb[sub 3]X[sub 8] (X = Cl, Br, I) layers. The work shows that the AFM and STM images are well described by the [rho](r[sub 0]) and [rho](r[sub 0], e[sub f]) plots, respectively. A combined use of AFM and STM is useful in characterizing the surfaces of layered materials, and calculations of [rho](r[sub 0]) and [rho](r[sub 0], e[sub f]) plots are indispensable in interpreting their AFM and STM images. 33 refs., 12 figs., 2 tabs.
DOE Contract Number:
FG05-86ER45259
OSTI ID:
5989534
Journal Information:
Journal of the American Chemical Society; (United States), Journal Name: Journal of the American Chemical Society; (United States) Vol. 115:6; ISSN JACSAT; ISSN 0002-7863
Country of Publication:
United States
Language:
English