Scanning probe microscopy study of layered dichalcogenide ReS{sub 2}

Journal Article · Wed Aug 24 04:00:00 EDT 1994 · Journal of the American Chemical Society

DOI:https://doi.org/10.1021/ja00096a048· OSTI ID:102767

Kelty, S P; Ruppert, A F; Chianelli, R R ^[1]; Ren, J; Whangbo, M H ^[2]

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1. Exxon Research and Engineering Company, Annandale, NJ (United States)
2. North Carolina State Univ., Raleigh, NC (United States)

The surface of the layered chalcogenide ReS{sub 2} was examined by atomic force microscopy (AFM) and scanning tunneling microscopy (STM), and the structure of ReS{sub 2} was determined by single crystal X-ray diffraction measurements. The observed atomic-resolution AFM and STM images were analyzed by calculating the total and partial electron density distributions [{rho}(r{sub o}) and {rho}(r{sub o}e{sub r}) respectively] of a single ReS{sub 2} layer taken from the bulk crystal structure. Our results show that the STM images are associated with the surface S atoms. The {rho}(r{sub o},e{sub f}) plots of the two tunneling processes differ in topography from the {rho}(r{sub o}) plot so that the surface atomic structure cannot be unambiguously deduced from the analysis of atomic-resolution STM images alone. Calculations of the {rho}(r{sub o}) and {rho}(r{sub o},e{sub f}) plots are essential for properly interpreting the atomic-resolution AFM and STM images. 27 refs., 11 figs., 1 tab.

• Sponsoring Organization: USDOE
• DOE Contract Number: FG05-86ER45259
• OSTI ID: 102767
• Journal Information: Journal of the American Chemical Society, Journal Name: Journal of the American Chemical Society Journal Issue: 17 Vol. 116; ISSN JACSAT; ISSN 0002-7863
• Country of Publication: United States
• Language: English

Related Subjects

40 CHEMISTRY
CATALYSTS
ELECTRON MICROSCOPY
ELECTRONIC STRUCTURE
MICROSCOPY
RHENIUM SULFIDES
SURFACE PROPERTIES
X-RAY DIFFRACTION