Tip-sample force interaction and surface local hardness in STM and AFM imaging
Conference
·
OSTI ID:468924
- North Carolina State Univ., Raleigh, NC (United States)
- Albert-Ludwigs Universitaet, Freiburg (Germany)
- Digital Instruments Inc., Santa Barbara, CA (United States)
STM and AFM images of various layered inorganic compounds, organic conducting salts and polymers were examined to assess the role of the tip-sample force interaction in scanning probe microscopy. To a first approximation, the AFM image of a sample surface is described by the total electron density plot {rho}(r{sub 0}), and the STM image by the partial electron density plot, {rho}(r{sub 0},e{sub f}). In these calculations, the structures of the surface layers are taken from the bulk crystal structures, so that a surface deformation induced by the tip force is neglected.
- DOE Contract Number:
- FG05-86ER45259
- OSTI ID:
- 468924
- Report Number(s):
- CONF-960877--
- Country of Publication:
- United States
- Language:
- English
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