Temperature dependence of threshold current for quantum-well Al/sub x/Ga/sub 1-x/As-GaAs heterostructure laser diodes
Journal Article
·
· Appl. Phys. Lett.; (United States)
Data are presented showing that the threshold current density J/sub th/(T) of quantum-well Al/sub x/Ga/sub 1-x/As-GaAs heterostructure laser diodes, grown by MO-CVD, is less temperature dependent than that of conventional DH lasers. T/sub 0/ in the usual expression J/sub th/proportionalexp(T/T/sub 0/) can be high as 437 /sup 0/C. This behavior is explained in terms of the steplike density of states and the disturbed electron and phonon distribution functions of the quantum-well active region.
- Research Organization:
- Department of Electrical Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
- OSTI ID:
- 5921609
- Journal Information:
- Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 36:1; ISSN APPLA
- Country of Publication:
- United States
- Language:
- English
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OSTI ID:5371374
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· Appl. Phys. Lett.; (United States)
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· Appl. Phys. Lett.; (United States)
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Related Subjects
42 ENGINEERING
420300* -- Engineering-- Lasers-- (-1989)
ALUMINIUM COMPOUNDS
ARSENIC COMPOUNDS
ARSENIDES
CHEMICAL COATING
CHEMICAL VAPOR DEPOSITION
COMPARATIVE EVALUATIONS
CURRENT DENSITY
CURRENTS
DATA
DEPOSITION
DISTRIBUTION FUNCTIONS
ELECTRIC CURRENTS
ENERGY-LEVEL DENSITY
EQUATIONS
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
INFORMATION
LASERS
MECHANICS
PNICTIDES
QUANTUM MECHANICS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SEMICONDUCTOR LASERS
SURFACE COATING
TEMPERATURE DEPENDENCE
420300* -- Engineering-- Lasers-- (-1989)
ALUMINIUM COMPOUNDS
ARSENIC COMPOUNDS
ARSENIDES
CHEMICAL COATING
CHEMICAL VAPOR DEPOSITION
COMPARATIVE EVALUATIONS
CURRENT DENSITY
CURRENTS
DATA
DEPOSITION
DISTRIBUTION FUNCTIONS
ELECTRIC CURRENTS
ENERGY-LEVEL DENSITY
EQUATIONS
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
INFORMATION
LASERS
MECHANICS
PNICTIDES
QUANTUM MECHANICS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SEMICONDUCTOR LASERS
SURFACE COATING
TEMPERATURE DEPENDENCE