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Temperature dependence of threshold current for coupled multiple quantum-well In/sub 1-x/Ga/sub x/ P/sub 1-z/As/sub z/-InP heterostructure laser diodes

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.328009· OSTI ID:5371374
Data are presented showing that the threshold current density, J/sub th/ (T)proportionalexp(T/T/sub 0/), of multiple quantum-well InGaPAs-InP heterostructure laser diodes, grown by LPE, exhibits a two-regime behavior similar to that of conventional InGaPAs-InP double-heterojunction lasers. At temperatures below a break-point temperature characteristic of the quaternary alloy, J/sub th/ (T) of these multiple quantum-well laser diodes is less temperature dependent (i.e., larger T/sub 0/, as high as 150 /sup 0/C) than that of regular quaternary DH lasers. At temperatures above the break-point temperature, J/sub th/ (T) is dominated by a poorly understood competing temperature-dependent nonradiative recombination process. In this range the T/sub 0/ of these multiple quantum-well diodes is similar to that of ordinary InGaPAs-InP DH diodes but, because of the large number of layers and large lower-temperature T/sub 0/, is not apt to be caused by defects at heterointerfaces.
Research Organization:
Department of Electrical Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
OSTI ID:
5371374
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 51:5; ISSN JAPIA
Country of Publication:
United States
Language:
English