Study of defects and radiation damage in solids by field-ion and atom-probe microscopy
A brief review is presented of: the basic physical principles of the field-ion and atom-probe microscopes; the many applications of these instruments to the study of defects and radiation damage in solids; and the application of the atom-probe field-ion microscope to the study of the behavior of implanted /sup 3/He and /sup 4/He in tungsten.
- Research Organization:
- Cornell Univ., Ithaca, NY (USA)
- DOE Contract Number:
- EY-76-S-02-3158
- OSTI ID:
- 5895339
- Report Number(s):
- COO-3158-78
- Country of Publication:
- United States
- Language:
- English
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