Atom-probe field ion microscopy
The atom-probe field ion microscope is an instrument with the ability to image individual atoms on a solid surface, to remove these atoms in a controlled, layer-by-layer, fashion, and to determine the chemical identity of the atoms as they are removed. The atom-prove field ion microscope is described, and selected applications of the technique in surface science are discussed. Applications in the areas of surface diffusion of single atoms and reconstruction of solid surfaces are discussed. Also discussed is the atom-probe mass spectrometer - an extension of the field ion microscope which allows determination of the chemical identity of atoms observed in the field ion microscope. A brief description of several different types of atom-probes is given. Applications are discussed, emphasizing surface chemical reactions, in particular, surface chemical reactions important in catalysis. (LEW)
- Research Organization:
- Sandia National Labs., Albuquerque, NM (USA)
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 6061160
- Report Number(s):
- SAND-86-0297C; CONF-860397-1; ON: DE86008403
- Country of Publication:
- United States
- Language:
- English
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