The atom-probe field ion microscope: Applications in surface science
Conference
·
OSTI ID:650375
The ability to locate an individual atom on a surface, remove it in a controlled fashion, and determine its chemical identity makes the atom-probe field-ion microscope an extremely powerful tool for the analysis of solid surfaces. By itself, the field ion microscope has contributed significantly to the understanding of surface atomic structure, single-atom surface diffusion, and the detailed interactions that occur between atoms and defects on surfaces. When used in combination with the atom-probe mass spectrometer there have been several additional areas within the traditional definition of ``surface science`` where the chemical identification capability of the atom probe has led to new insights. In this paper these applications are reviewed focusing on two specific areas: surface segregation in intermetallic alloys and chemical reactions on metal surfaces.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 650375
- Report Number(s):
- SAND--98-0520C; CONF-980713--; ON: DE98005037; BR: KC0202020
- Country of Publication:
- United States
- Language:
- English
Similar Records
Atom-probe field ion microscopy
Novel applications of the field ion microscope and atom-probe
Analysis at the atomic level - The atom probe field-ion microscope
Conference
·
Tue Dec 31 23:00:00 EST 1985
·
OSTI ID:6061160
Novel applications of the field ion microscope and atom-probe
Conference
·
Sat Dec 31 23:00:00 EST 1988
·
OSTI ID:6086143
Analysis at the atomic level - The atom probe field-ion microscope
Journal Article
·
Sun May 01 00:00:00 EDT 1988
· Journal of Research of the National Bureau of Standards
·
OSTI ID:2471376