Analysis at the atomic level - The atom probe field-ion microscope
Journal Article
·
· Journal of Research of the National Bureau of Standards
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
The atom probe field-ion microscope (APFIM) is a unique analytical instrument that can analyze metals and semiconducting materials on the atomic scale. In recent years, the atom probe has developed into one of the most powerful instruments available for routine microstructural and micro chemical analysis of materials. The types of investigations that have been performed have encompassed many diverse metallurgical subjects including phase transformations, segregation, diffusion, catalysis, and radiation damage.
- Research Organization:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE)
- Grant/Contract Number:
- AC05-00OR22725
- OSTI ID:
- 2471376
- Journal Information:
- Journal of Research of the National Bureau of Standards, Journal Name: Journal of Research of the National Bureau of Standards Journal Issue: 3 Vol. 93; ISSN 0160-1741
- Publisher:
- National Bureau of StandardsCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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