Analysis at the atomic level: The atom probe field-ion microscope
Conference
·
OSTI ID:6049110
The atom probe field-ion microscope (APFIM) is a unique analytical instrument that can analyze metals and semiconducting materials on the atomic scale. In recent years, the atom probe has developed into one of the most powerful instruments available for routine microstructural and microchemical analysis of materials. The types of investigations that have been performed have encompassed many diverse metallurgical subjects including phase transformations, segregation, diffusion, catalysis, and radiation damage. 3 refs., 3 figs.
- Research Organization:
- Oak Ridge National Lab., TN (USA)
- DOE Contract Number:
- AC05-84OR21400
- OSTI ID:
- 6049110
- Report Number(s):
- CONF-870992-1; ON: DE88000572
- Country of Publication:
- United States
- Language:
- English
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Analysis at the atomic level - The atom probe field-ion microscope
Atom probe field ion microscopy
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Atom probe field ion microscopy
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· Scr. Metall.; (United States)
·
OSTI ID:5461115
Related Subjects
36 MATERIALS SCIENCE
360102* -- Metals & Alloys-- Structure & Phase Studies
360602 -- Other Materials-- Structure & Phase Studies
ATOMS
CHEMICAL ANALYSIS
CRYSTAL STRUCTURE
ELEMENTS
IMAGES
ION MICROSCOPY
MASS SPECTROMETERS
MATERIALS
MEASURING INSTRUMENTS
METALS
MICROSCOPY
MICROSTRUCTURE
RESOLUTION
SEMICONDUCTOR MATERIALS
SPECTROMETERS
360102* -- Metals & Alloys-- Structure & Phase Studies
360602 -- Other Materials-- Structure & Phase Studies
ATOMS
CHEMICAL ANALYSIS
CRYSTAL STRUCTURE
ELEMENTS
IMAGES
ION MICROSCOPY
MASS SPECTROMETERS
MATERIALS
MEASURING INSTRUMENTS
METALS
MICROSCOPY
MICROSTRUCTURE
RESOLUTION
SEMICONDUCTOR MATERIALS
SPECTROMETERS