Atom-probe field-ion microscope for the study of the interaction of impurity atoms or alloying elements with defects
A time-of-flight (TOF) atom-probe field-ion microscope (FIM) designed for the study of defects is described. This atom probe features: (1) a variable magnification internal-image-intensification system; (2) a liquid-helium goniometer stage; (3) a low-energy (less than or equal 3 keV) gas-ion gun for in-situ irradiations; (4) an ultra-high vacuum (approximately 3.10/sup -10/ torr) chamber; (5) a high vacuum (approximately 10/sup -6/ torr) specimen-exchange device; (6) a Chevron ion detector; and (7) an eight-channel digital timer with a +-10 nsec resolution for measuring the TOFs. The entire process of applying the evaporation pulse to the specimen, measuring the voltages, and analyzing the TOF data is controlled by a computer. With this system we can record and analyze 600 TOFmin. Results on unirradiated specimens of molybdenum, tungsten, W/25 at. % Re, Mo/1.0 at. % Ti, Mo/1.0 at. % Ti/0.08 at. % Zr and a special low swelling stainless steel alloy (LS1A) demonstrate the instrument's ability to quantitatively determine concentrations at the 5.10/sup -4/ at fr level and to determine their spatial distribution with a resolution of a few angstroms.
- Research Organization:
- Cornell Univ., Ithaca, NY (USA)
- DOE Contract Number:
- EY-76-S-02-3158
- OSTI ID:
- 7124728
- Report Number(s):
- COO-3158-51; CONF-761027-10
- Country of Publication:
- United States
- Language:
- English
Similar Records
Time-of-flight atom-probe field-ion microscope for the study of defects in metals. Report No. 2357. [W--25 at. % Re]
Atom probe field ion microscope study of the range and diffusivity of helium in tungsten
Related Subjects
360102 -- Metals & Alloys-- Structure & Phase Studies
440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
ALLOYS
CHROMIUM ALLOYS
CORROSION RESISTANT ALLOYS
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
DESIGN
IMPURITIES
ION MICROSCOPES
ION MICROSCOPY
IRON ALLOYS
IRON BASE ALLOYS
MASS SPECTROMETERS
MEASURING INSTRUMENTS
MICROSCOPES
MICROSCOPY
MOLYBDENUM ALLOYS
MOLYBDENUM BASE ALLOYS
RHENIUM ALLOYS
SPECTROMETERS
STAINLESS STEELS
STEELS
TIME-OF-FLIGHT METHOD
TITANIUM ALLOYS
TUNGSTEN ALLOYS
TUNGSTEN BASE ALLOYS
ZIRCONIUM ALLOYS