Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Atom probe field ion microscope study of the range and diffusivity of helium in tungsten

Technical Report ·
DOI:https://doi.org/10.2172/6427378· OSTI ID:6427378

A time-of-flight (TOF) atom-probe field-ion microscope (FIM) specifically designed for the study of defects in metals is described. With this automated system 600 TOF min/sup -1/ can be recorded and analyzed. Performance tests of the instrument demonstrated that (1) the seven isotopes of molybdenum and the five isotopes of tungsten can be clearly resolved; and (2) the concentration and spatial distribution of all constitutents present at levels greater than 0.05 at. % in a W--25 at. % Re, Mo--1.0 at. % Ti, Mo--1.0 at. % Ti--0.08 at. % Zr (TZM), a low swelling stainless steel (LS1A) and a metallic glass (Metglas 2826) can be measured. The effect of the rate of field evaporation on the quantitative atom probe analysis of a Mo--1.0 at. % Ti alloy and a Mo--1.0 at. % Ti--0.08 at. % Zr alloy was investigated. As the field evaporation rate increased the measured Ti concentration was found to also increase. A simple qualitative model was proposed to explain the observation. The spatial distribution of titanium in a fast neutron irradiated Mo--1.0 at. % Ti alloy has been investigated. No evidence of Ti segregation to the voids was detected nor has any evidence of significant resolution of Ti from the TiC precipitates been detected. A small amount of segregation of carbon to a void was detected.

Research Organization:
Cornell Univ., Ithaca, NY (USA). Materials Science Center
DOE Contract Number:
EY-76-S-02-3158
OSTI ID:
6427378
Report Number(s):
COO-3158-63
Country of Publication:
United States
Language:
English