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Summary of recent studies on AlGaAs/GaAs radiation hardened photodiodes

Conference ·
OSTI ID:5892059
In this paper, we summarize the results of several studies assessing the radiation hardness of a new type of double heterojunction, AlGaAs/GaAs photodiode. These studies include transient and permanent damage experiments. Transient studies indicate that double heterostructure AlGaAs/GaAs photodiodes generate 40 times less photocurrent than conventional silicon photodiodes during exposure to ionizing-radiation pulses. Permanent damage studies with neutrons, Co/sup 60/ gamma rays, and high energy electron beam sources indicate only minor changes in operational characteristics after exposures. These studies have shown a 20% degradation in optical response and a factor of 8 increase in photodiode leakage current after exposure to 3.6 x 10/sup 15/ neutron/cm/sup 2/ fluence. Conventional silicon photodiodes exhibit this type of degradation after exposures to 10/sup 12/ to 10/sup 13/ neutrons/cm/sup 2/ fluences. These characteristics are important for many specialized applications requiring radiation hardness.
Research Organization:
Sandia National Labs., Albuquerque, NM (USA)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
5892059
Report Number(s):
SAND-84-2678C; CONF-850345-6; ON: DE85009501
Country of Publication:
United States
Language:
English