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Permanent damage effects in Si and AlGaAs/GaAs photodiodes

Conference ·
OSTI ID:5218827
A study of permanent damage effects in photodiodes due to total dose exposures of 10/sup 8/ rad (Si) ionizing-radiation from a /sup 60/Co source is discussed. Specifically, the degradation of optical quantum efficiency and increases in photodiode leakage current in Si PIN structures are compared with specially designed and fabricated, double heterostructure AlGaAs/GaAs photodiodes. Results indicate some degradation in quantum efficiency (20 to 30%) for both types of devices. Leakage currents were found to increase significantly after 10/sup 8/ rad in the Si PIN structures but only increase slightly in the AlGaAs/GaAs structures.
Research Organization:
Sandia National Labs., Albuquerque, NM (USA)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
5218827
Report Number(s):
SAND-82-0775C; CONF-820708-7; ON: DE82018292
Country of Publication:
United States
Language:
English