Angle-resolved photoemission extended fine structure
Measurements of the Angle-Resolved Photoemission Extended Fine Structure (ARPEFS) from the S(1s) core level of a c(2 x 2)S/Ni(001) are analyzed to determine the spacing between the S overlayer and the first and second Ni layers. ARPEFS is a type of photoelectron diffraction measurement in which the photoelectron kinetic energy is swept typically from 100 to 600 eV. By using this wide range of intermediate energies we add high precision and theoretical simplification to the advantages of the photoelectron diffraction technique for determining surface structures. We report developments in the theory of photoelectron scattering in the intermediate energy range, measurement of the experimental photoemission spectra, their reduction to ARPEFS, and the surface structure determination from the ARPEFS by combined Fourier and multiple-scattering analyses. 202 refs., 67 figs., 2 tabs.
- Research Organization:
- Lawrence Berkeley Lab., CA (USA)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 5860703
- Report Number(s):
- LBL-19215; ON: DE85010980
- Country of Publication:
- United States
- Language:
- English
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Angle-resolved-photoemission extended-fine-structure spectroscopy investigation of c(2 x 2) S/Ni(011)
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Related Subjects
Molecular & Chemical Physics-- Beams & their Reactions
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ANGULAR DISTRIBUTION
COHERENT SCATTERING
COLLISIONS
DATA
DIFFRACTION
DISTRIBUTION
ELECTRON COLLISIONS
ELECTRON DIFFRACTION
ELECTRON EMISSION
ELEMENTS
EMISSION
EXPERIMENTAL DATA
FINE STRUCTURE
FOURIER TRANSFORMATION
FUNCTIONS
INFORMATION
INTEGRAL TRANSFORMATIONS
METALS
MULTIPLE SCATTERING
NICKEL
NUMERICAL DATA
PHOTOELECTRIC EMISSION
RAMSAUER EFFECT
SCATTERING
TRANSFORMATIONS
TRANSITION ELEMENTS
WAVE FUNCTIONS