Angle-resolved photoemission extended fine structure

Conference · Thu Sep 01 04:00:00 EDT 1983

OSTI ID:5426049

Barton, J J; Bahr, C C; Hussain, Z; Robey, S W; Klebanoff, L E; Shirley, D A

Core level angle-resolved photoemission intensity oscillates sinusoidally with increasing photoelectron momentum. Interference between direct and scattered photo-emission causes this angle-resolved photoemission extended fine structure (ARPEFS). We will discuss an analytic single-scattering theory which quantitatively describes the oscillations. The procedures for extracting surface geometry information from photoemission measurements will be illustrated with S(1s) ARPEFS from S on Ni(100) and Cu(100) obtained with the soft X-ray double crystal monochromator at the Stanford Synchrotron Radiation Laboratory. Building on the surface sensitivity and chemical selectivity of photoemission, ARPEFS analysis provides direct geometrical information from the oscillation frequencies (derived with auto-regressive Fourier analysis), from intensity changes with polarization and analyzer position, and from analysis of scattering phase-shift zero-crossings.

• Research Organization: Lawrence Berkeley Lab., CA (USA)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 5426049
• Report Number(s): LBL-16298; CONF-8310172-8; ON: DE84002899
• Country of Publication: United States
• Language: English

Related Subjects

440103 -- Radiation Instrumentation-- Nuclear Spectroscopic Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
640304* -- Atomic
Molecular & Chemical Physics-- Collision Phenomena
74 ATOMIC AND MOLECULAR PHYSICS
ANGULAR DISTRIBUTION
BREMSSTRAHLUNG
CRYSTAL STRUCTURE
DISTRIBUTION
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
EMISSION
FINE STRUCTURE
MEASURING METHODS
PHOTOELECTRON SPECTROSCOPY
PHOTOEMISSION
RADIATIONS
SECONDARY EMISSION
SPECTROSCOPY
SURFACES
SYNCHROTRON RADIATION