Angle-resolved photoemission extended fine structure

Conference · Thu Sep 01 00:00:00 EDT 1983

OSTI ID:5426049

Barton, J J; Bahr, C C; Hussain, Z; Robey, S W; Klebanoff, L E; Shirley, D A

Core level angle-resolved photoemission intensity oscillates sinusoidally with increasing photoelectron momentum. Interference between direct and scattered photo-emission causes this angle-resolved photoemission extended fine structure (ARPEFS). We will discuss an analytic single-scattering theory which quantitatively describes the oscillations. The procedures for extracting surface geometry information from photoemission measurements will be illustrated with S(1s) ARPEFS from S on Ni(100) and Cu(100) obtained with the soft X-ray double crystal monochromator at the Stanford Synchrotron Radiation Laboratory. Building on the surface sensitivity and chemical selectivity of photoemission, ARPEFS analysis provides direct geometrical information from the oscillation frequencies (derived with auto-regressive Fourier analysis), from intensity changes with polarization and analyzer position, and from analysis of scattering phase-shift zero-crossings.

• Research Organization: Lawrence Berkeley Lab., CA (USA)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 5426049
• Report Number(s): LBL-16298; CONF-8310172-8; ON: DE84002899
• Resource Relation: Conference: Advances in soft x-ray science and technology conference, Upton, NY, USA, 17 Oct 1983
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
PHOTOELECTRON SPECTROSCOPY
ANGULAR DISTRIBUTION
SURFACES
CRYSTAL STRUCTURE
FINE STRUCTURE
MEASURING METHODS
PHOTOEMISSION
SYNCHROTRON RADIATION
BREMSSTRAHLUNG
DISTRIBUTION
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
EMISSION
RADIATIONS
SECONDARY EMISSION
SPECTROSCOPY
640304* - Atomic
Molecular & Chemical Physics- Collision Phenomena
440103 - Radiation Instrumentation- Nuclear Spectroscopic Instrumentation