Angle-resolved-photoemission extended-fine-structure spectroscopy investigation of c(2 x 2) S/Ni(011)
Measurements of the extended fine structure in the photoemission intensity from the S(1s) core level were performed for a c(2 x 2) overlayer of S on Ni(011). Four experimental geometries were employed, making this the most complete angle-resolved-photoemission extended-fine-structure (ARPEFS) study to date. Surface structural information was extracted from the ARPEFS using a combination of Fourier-transform techniques and comparisons to multiple-scattering calculations. The results of this analysis are in excellent agreement with previous studies of this system indicating that S adsorbs in a rectangular hollow site 2.20 +- 0.02 A above a second-layer Ni atom. We further present evidence for a buckling of the second Ni layer, giving an expansion in the separation between the first Ni layer and the second-layer Ni atoms covered by S atoms of 11% from the bulk value, while second-layer Ni atoms not covered in the c(2 x 2) structure assume essentially bulk positions. We also examine in detail the effects of multiple scattering on the extraction of this structural information from ARPEFS and present results for surfaces with S coverages greater than 1/2 monolayer.
- Research Organization:
- Materials and Molecular Research Division, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720; Department of Physics and Department of Chemistry, University of California, Berkeley, California 94720
- OSTI ID:
- 5827802
- Journal Information:
- Phys. Rev. B: Condens. Matter; (United States), Vol. 35:3
- Country of Publication:
- United States
- Language:
- English
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