Angle-resolved-photoemission extended-fine-structure spectroscopy investigation of c(2 x 2) S/Ni(011)

Journal Article · Thu Jan 15 04:00:00 EST 1987 · Phys. Rev. B: Condens. Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.35.1108· OSTI ID:5827802

Robey, S W; Barton, J J; Bahr, C C; Liu, G; Shirley, D A

Measurements of the extended fine structure in the photoemission intensity from the S(1s) core level were performed for a c(2 x 2) overlayer of S on Ni(011). Four experimental geometries were employed, making this the most complete angle-resolved-photoemission extended-fine-structure (ARPEFS) study to date. Surface structural information was extracted from the ARPEFS using a combination of Fourier-transform techniques and comparisons to multiple-scattering calculations. The results of this analysis are in excellent agreement with previous studies of this system indicating that S adsorbs in a rectangular hollow site 2.20 +- 0.02 A above a second-layer Ni atom. We further present evidence for a buckling of the second Ni layer, giving an expansion in the separation between the first Ni layer and the second-layer Ni atoms covered by S atoms of 11% from the bulk value, while second-layer Ni atoms not covered in the c(2 x 2) structure assume essentially bulk positions. We also examine in detail the effects of multiple scattering on the extraction of this structural information from ARPEFS and present results for surfaces with S coverages greater than 1/2 monolayer.

• Research Organization: Materials and Molecular Research Division, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720; Department of Physics and Department of Chemistry, University of California, Berkeley, California 94720
• OSTI ID: 5827802
• Journal Information: Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 35:3; ISSN PRBMD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360604* -- Materials-- Corrosion
Erosion
& Degradation
CRYSTAL STRUCTURE
ELECTRON SPECTROSCOPY
ELEMENTS
ENERGY SPECTRA
FILMS
FINE STRUCTURE
METALS
MICROSTRUCTURE
NICKEL
NONMETALS
PHOTOELECTRON SPECTROSCOPY
RESOLUTION
SPATIAL RESOLUTION
SPECTRA
SPECTROSCOPY
SUBSTRATES
SULFUR
SURFACE PROPERTIES
THIN FILMS
TRANSITION ELEMENTS