Charge yield for cobalt-60 and 10-keV x-ray irradiations of MOS devices

Conference · Sat Nov 30 23:00:00 EST 1991 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

DOI:https://doi.org/10.1109/23.124092· OSTI ID:5826064

Shaneyfelt, M R; Fleetwood, D M; Schwank, J R ^[1]; Hughes, K L ^[2]

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1. Sandia National Labs., Albuquerque, NM (United States)
2. L and M Technologies, Albuquerque, NM (US)

In this paper the radiation response of MOS devices exposed to {sup 60}Co and low-energy ({approximately}10 keV) x-ray irradiation is evaluated as a function of electric field during exposure. Improved charge yield estimates are obtained for {sup 60}Co irradiations at fields below 1 MV/cm by matching voltage shifts due to oxide-trap and interface-trap charge to an E{sup {minus}0.55} electric field dependence. Combining these improved charge yield estimates and calculated dose enhancement factors, the relative response of x-ray to {sup 60}Co irradiations is accurately predicted for oxide electric fields from 0.03 MV/cm to 5.0 MV/cm. The ability to predict the relative response of x-ray to {sup 60}Co irradiations should speed acceptance of x-ray testers as a hardness assurance tool.

• DOE Contract Number: AC04-76DP00789
• OSTI ID: 5826064
• Report Number(s): CONF-910751--
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 38:6; ISSN 0018-9499; ISSN IETNA
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BETA DECAY RADIOISOTOPES
BETA-MINUS DECAY RADIOISOTOPES
CHARGE COLLECTION
COBALT 60
COBALT ISOTOPES
DOSE RATES
ELECTROMAGNETIC RADIATION
ENERGY RANGE
HARDENING
INTERFACES
INTERMEDIATE MASS NUCLEI
INTERNAL CONVERSION RADIOISOTOPES
IONIZING RADIATIONS
ISOMERIC TRANSITION ISOTOPES
ISOTOPES
KEV RANGE
KEV RANGE 01-10
MINUTES LIVING RADIOISOTOPES
MOS TRANSISTORS
NUCLEI
ODD-ODD NUCLEI
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
RADIATIONS
RADIOISOTOPES
SEMICONDUCTOR DEVICES
TRANSISTORS
X RADIATION
YEARS LIVING RADIOISOT