Skip to main content
OSTI.GOVU.S. Department of Energy Office of Scientific and Technical Information
U.S. Department of Energy
Office of Scientific and Technical Information
 

Guidelines for predicting single-event upsets in neutron environments

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:5812460
 [1];  [2]
  1. Severn Communications Corp., Severna Park, MD (United States)
  2. Boeing Aerospace Co., Seattle, WA (United States)
+ Show Author Affiliations

Single-event upsets (SEUs) in aerospace applications may generally be attributed to direct ionization by heavy nuclei in galactic cosmic radiation or to energetic recoils of substrate nuclei interacting with high-energy (E {gt} 10 MeV) protons. In some aerospace applications the radiation environment is dominated by neutrons which are expected to be the principal cause of SEUs. These environments include the atmosphere at aircraft altitudes, in the vicinity of nuclear reactors and other neutron sources, nuclear weapons environments, and within heavily shielded spacecraft. Neutron-induced SEUs have been demonstrated in the laboratory and procedures for estimating error rates have been defined. In this paper utilizing the author's most recent computations of neutron burst generation rates, the authors introduce a simple, graphical technique for estimating neutron-induced error rates in various neutron environments.

OSTI ID:
5812460
Report Number(s):
CONF-910751--
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 38:6; ISSN 0018-9499; ISSN IETNA
Country of Publication:
United States
Language:
English

Similar Records

Neutron-induced single event upsets in static RAMS observed at 10 km flight altitude
Journal Article · Wed Mar 31 23:00:00 EST 1993 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) · OSTI ID:6535585
Incorporation of ENDF-V neutron cross section data for calculating neutron-induced single event upsets
Conference · Thu Nov 30 23:00:00 EST 1989 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) · OSTI ID:6948193
In-flight and ground testing of single event upset sensitivity in static RAMs
Journal Article · Mon Jun 01 00:00:00 EDT 1998 · IEEE Transactions on Nuclear Science · OSTI ID:644171

Related Subjects

661320* -- Auroral
Ionospheric
& Magnetospheric Phenomena-- (1992-)
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
AIRCRAFT
BARYONS
COSMIC RADIATION
EARTH ATMOSPHERE
ELEMENTARY PARTICLES
ENERGY RANGE
FERMIONS
FORECASTING
GALAXIES
HADRONS
HEAVY NUCLEI
INTERACTIONS
IONIZATION
IONIZING RADIATIONS
MEV RANGE
MEV RANGE 01-10
NEUTRON SOURCES
NEUTRONS
NUCLEI
NUCLEONS
PARTICLE SOURCES
PROTONS
RADIATION EFFECTS
RADIATION SOURCES
RADIATIONS
REGULATIONS
SUBSTRATES
USES
VARIATIONS