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GaInAsP/InP planar stripe lasers prepared by using sputtered SiO/sub 2/ film as a Zn-diffusion mask

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.327340· OSTI ID:5802042
The dependence of lasing characteristics on stripe width in GaInAsP/InP double-heterostructure planar stripe lasers, prepared by using sputtered SiO/sub 2/ film as a Zn-diffusion mask, was investigated. The lasers of 10-, 15-, and 20-..mu..m-wide stripes operated in a fundamental-transverse mode with more than 20% differential quantum efficiencies per facet, while the 5-..mu..m-wide stripe lasers operated in a multi-transverse-mode even just above threshold. The threshold current of 5-..mu..m-wide stripe lasers increased greatly, and the lasing wavelengths shifted to shorter than those of stripe lasers with larger stripe widths. The 15-..mu..m-wide stripe lasers showed good mode characteristics to operate in a fundamental-transverse mode up to the output power of 22 mW per facet and in a single longitudinal mode over a wide range of currents. The cause of this dependence of lasing characteristics on stripe width was discussed, and it was assumed that the Zn diffusion into the stripe region using a sputtered SiO/sub 2/ mask is most responsible for the dependence.
Research Organization:
Musashino Electrical Communication Laboratory, Nippon Telegraph and Telepone Public Corporation, Musashino, Tokyo, 180, Japan
OSTI ID:
5802042
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 51:1; ISSN JAPIA
Country of Publication:
United States
Language:
English