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Optical absorption and positron annihilation in electron-irradiated GaAs

Journal Article · · Sov. Phys. - Semicond. (Engl. Transl.); (United States)
OSTI ID:5795122
The 2..gamma.. positron annihilation method was used to establish for the first time that deep-level defects in GaAs irradiated with 2 MeV electrons at Tapprox.300 /sup 0/K were of the vacancy type. The dominant defect was the vacancy v/sub Ga/, responsible for the absorption band at 1.0 eV. The sensitivity threshold was determined for the 2..gamma.. method when applied to GaAs irradiated with an electron dose of approx.7 x 10/sup 16/ cm/sup -2/.
Research Organization:
Scientific-Research Institute of Nuclear Physics at the S. M. Kirov Polytechnic Institute, Tomsk
OSTI ID:
5795122
Journal Information:
Sov. Phys. - Semicond. (Engl. Transl.); (United States), Journal Name: Sov. Phys. - Semicond. (Engl. Transl.); (United States) Vol. 13:6; ISSN SPSEA
Country of Publication:
United States
Language:
English