Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Positron annihilation in electron-irradiated n-type InP

Journal Article · · Sov. Phys. - Semicond. (Engl. Transl.); (United States)
OSTI ID:5067582
A study was made of the positron annihilation and electrical properties of n-type InP crystals (n/sub 0/roughly-equal2 x 10/sup 17/ cm/sup -3/) irradiated at 300 /sup 0/K with approx.2 MeV electrons in doses up to approx.1 x 10/sup 19/ cm/sup -2/. Narrowing of the correlation curves of the annihilation radiation and an increase in the intensity of the narrow component were the effects of electron irradiation. The electrical properties of n-type InP were determined after large electron doses: R/sub Htslim/roughly-equal2 x 10/sup 6/ cm/sup 3//C and R/sub H/sigmaroughly-equal300--400 cm/sup 2/ x V/sup -1/ x sec/sup -1/ at 300 /sup 0/K. Annealing of radiation defects was observed in the temperature range 300--700 /sup 0/K.
Research Organization:
S. M. Kirov Polytechnic Institute, Tomsk
OSTI ID:
5067582
Journal Information:
Sov. Phys. - Semicond. (Engl. Transl.); (United States), Journal Name: Sov. Phys. - Semicond. (Engl. Transl.); (United States) Vol. 16:2; ISSN SPSEA
Country of Publication:
United States
Language:
English