Extended photoemission fine structure analysis of the Si(111)-(7[times]7) surface core levels
Journal Article
·
· Physical Review Letters; (United States)
- Department of Physics, University of Illinois, 1110 West Green Street, Urbana, Illinois 61801 (United States) Materials Research Laboratory, University of Illinois, 104 South Goodwin Avenue, Urbana, Illinois 61801 (United States)
The surface- and bulk-derived components of the Si 2[ital p] core levels, acquired by photoemission from Si(111)-(7[times]7), show strong and different oscillations caused by extended fine structure above the 2[ital p] edge. An analysis of these oscillations yields the bulk and surface bond lengths which agree well with the known structure. The heretofore controversial issues of the photoemission escape depth and the atomic origin of the surface core levels are resolved.
- DOE Contract Number:
- FG02-91ER45439
- OSTI ID:
- 5723488
- Journal Information:
- Physical Review Letters; (United States), Journal Name: Physical Review Letters; (United States) Vol. 71:18; ISSN 0031-9007; ISSN PRLTAO
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360602 -- Other Materials-- Structure & Phase Studies
360606 -- Other Materials-- Physical Properties-- (1992-)
665100* -- Nuclear Techniques in Condensed Matter Physics -- (1992-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BINDING ENERGY
BOND LENGTHS
BREMSSTRAHLUNG
DIMENSIONS
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
ELEMENTS
EMISSION
ENERGY
FINE STRUCTURE
LENGTH
OSCILLATIONS
PHOTOELECTRON SPECTROSCOPY
PHOTOEMISSION
RADIATIONS
SECONDARY EMISSION
SEMIMETALS
SILICON
SPECTRAL RESPONSE
SPECTROSCOPY
SURFACE PROPERTIES
SYNCHROTRON RADIATION
360602 -- Other Materials-- Structure & Phase Studies
360606 -- Other Materials-- Physical Properties-- (1992-)
665100* -- Nuclear Techniques in Condensed Matter Physics -- (1992-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BINDING ENERGY
BOND LENGTHS
BREMSSTRAHLUNG
DIMENSIONS
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
ELEMENTS
EMISSION
ENERGY
FINE STRUCTURE
LENGTH
OSCILLATIONS
PHOTOELECTRON SPECTROSCOPY
PHOTOEMISSION
RADIATIONS
SECONDARY EMISSION
SEMIMETALS
SILICON
SPECTRAL RESPONSE
SPECTROSCOPY
SURFACE PROPERTIES
SYNCHROTRON RADIATION