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Very low current threshold GaAs-Al/sub x/Ga/sub 1-x/As double-heterostructure lasers grown by molecular beam epitaxy

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.91297· OSTI ID:5707046

GaAs-Al/sub x/Ga/sub 1-x/As (x=0.3) double-heterostructure (DH) lasers having very low current threshold densities have been prepared by molecular beam epitaxy (MBE). For DH lasers having Al-mole-fraction differences between the active layers and Al/sub x/Ga/sub 1-x/As confinement layers ..delta..xapprox.0.3, the best of the MBE-grown DH laser wafers have averaged current threshold densities similar to those obtained from the best of similar-geometry DH lasers prepared by liquid-phase epitaxy (LPE) and by metalorganic chemical vapor deposition (MO-CVD). With ..delta..x=0.3, the lowest averaged current threshold density achieved is 800 A/cm/sup 2/ (without reflective coating) for a wafer with an active layer thickness of 0.15 ..mu..m.

Research Organization:
Bell Laboratories, Murray Hill, New Jersey 07974
OSTI ID:
5707046
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 36:1; ISSN APPLA
Country of Publication:
United States
Language:
English