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Upper-bound SEU rate for devices in an isotropic or nonisotropic flux

Technical Report ·
OSTI ID:5694147
A method for constructing upper bound estimates for device single event upset (SEU) rates is presented. A directional Heinrich flux, as a function of direction, must be known. A computer code, included, converts the directional Heinrich flux into an 'effective flux'. The effective flux provides a simple way to estimate upper bound SEU rates for devices with a known normal incident cross section versus LET curve.
Research Organization:
Jet Propulsion Lab., Pasadena, CA (United States)
OSTI ID:
5694147
Report Number(s):
N-92-16725; NASA-CR--189765; JPL-PUBL--91-32; NAS--1.26:189765
Country of Publication:
United States
Language:
English

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Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGED PARTICLES
COMPUTER CODES
ELECTRONIC EQUIPMENT
ENERGY TRANSFER
EQUIPMENT
FAILURES
ISOTROPY
LIMITING VALUES
MATHEMATICAL MODELS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS