SEU cross sections derived from a diffusion analysis
Journal Article
·
· IEEE Transactions on Nuclear Science
- California Inst. of Tech., Pasadena, CA (United States). Jet Propulsion Lab.
A simple theoretical prediction of single-event upset (SEU) cross section versus linear energy transfer (LET) is derived from a diffusion analysis, and the result is compared to some real device curves. It was found that at least some real device curves show two regimes. One regime (high-LET) is characterized by a very good fit to the theoretical prediction, and the other (low-LET) is characterized by a very bad fit. The existence of a high-LET regime provides additional credibility for the increasingly popular postulate that diffusion has an important effect on the shape of the cross-sectional curve.
- OSTI ID:
- 445384
- Journal Information:
- IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6Pt2 Vol. 43; ISSN 0018-9499; ISSN IETNAE
- Country of Publication:
- United States
- Language:
- English
Similar Records
Observation and prediction of SEU in Hitachi SRAMs in low altitude polar orbits
Upper-bound SEU rate for devices in an isotropic or nonisotropic flux
A new method for using sup 252 CF in SEU testing
Conference
·
Tue Nov 30 23:00:00 EST 1993
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:6839981
Upper-bound SEU rate for devices in an isotropic or nonisotropic flux
Technical Report
·
Thu Aug 01 00:00:00 EDT 1991
·
OSTI ID:5694147
A new method for using sup 252 CF in SEU testing
Conference
·
Fri Nov 30 23:00:00 EST 1990
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA)
·
OSTI ID:5722036