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A new method for using sup 252 CF in SEU testing

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA)
OSTI ID:5722036
; ; ;  [1]; ;  [2];  [3]
  1. Rensselaer Polytechnic Inst., Troy, NY (USA)
  2. Jet Propulsion Lab., Pasadena, CA (USA)
  3. Grumman Corp., Bethpage, NY (USA). Corporate Research Center
A system using {sup 252}Cf and associated nuclear instrumentation has determined the SEU cross section versus LET curve for several 2kx8 SRAMs. The {sup 252}Cf fission fragments pass through at thin film organic scintillator detector (TFD) on the way to the device under test (DUT). The TFD provides energy information for each transiting fragment. Data analysis provides the energy of the individual ion responsible for each SEU, thus separate upset cross sections can be developed for different energy and mass regions of the californium spectrum. The authors report on this measurement of separate cross sections for each fission fragment group. This californium-based device is quite small and fits onto a bench top. It provides a convenient and inexpensive supplement or alternative to accelerator and high-altitude/space SEU testing.
OSTI ID:
5722036
Report Number(s):
CONF-900723--
Conference Information:
Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) Journal Volume: 37:6
Country of Publication:
United States
Language:
English