Improved /sup 252/Cf single-event-upset simulation technique for testing microelectronics
Considerable effort is now being expended at accelerators to test microelectronics for single event upset (SEU) from energetic heavy ions. Testing with /sup 252/Cf spontaneous fission fragments is far less expensive and more readily accessible than accelerator testing, but uncertainties associated with currently used averages over the fragment distribution severely limit the validity of californium testing. This paper presents a new approach, which utilizes the properties of the californium fission process to significantly reduce the uncertainties inherent in current testing systems. By measuring SEU in coincidence with the kinetic energy and the mass, or just the kinetic energy, of the oppositely emitted fission fragment, /sup 252/Cf can be used to provide an accurate determination of both the mass of the fragment and its LET as it penetrates the DUT. The kinetic energy and mass of fission fragments can readily by determined by the E - dE/dX measurement technique. Representative systems utilizing gridded Fisch ionization chambers, surface barrier silicon diodes, or thin film plastic scintillators have been identified and evaluated as being suitable for this application.
- Research Organization:
- Sandia National Lab., Albuquerque, NM
- OSTI ID:
- 5519146
- Report Number(s):
- CONF-870601-; TRN: 88-010155
- Journal Information:
- Trans. Am. Nucl. Soc.; (United States), Vol. 54; Conference: Annual meeting of the American Nuclear Society, Dallas, TX, USA, 7 Jun 1987
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
INTEGRATED CIRCUITS
TESTING
ACCELERATORS
ACCURACY
CALIFORNIUM 252
FISSION
IONIZATION CHAMBERS
SILICON
ACTINIDE ISOTOPES
ACTINIDE NUCLEI
ALPHA DECAY RADIOISOTOPES
CALIFORNIUM ISOTOPES
ELECTRONIC CIRCUITS
ELEMENTS
EVEN-EVEN NUCLEI
HEAVY NUCLEI
ISOTOPES
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
NUCLEAR REACTIONS
NUCLEI
RADIATION DETECTORS
RADIOISOTOPES
SEMIMETALS
YEARS LIVING RADIOISOTOPES
440200* - Radiation Effects on Instrument Components
Instruments
or Electronic Systems