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A summary of SEU test results using californium-252

Conference · · IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:6065319
This paper presents a summary of four years Single Event Upset (SEU) test results on a wide range of devices and technologies using Californium-252 having an average Linear Energy Transfer (LET) = 43 MeV/(mg/sqcm). Sensitivity variations are highlighted, particularly for nominally identical devices. The significance of the testing and test data with respect to recent devices and technologies is discussed.
Research Organization:
European Space Agency/ESTEC, Components Div., Noordwijk (NL); AERE Harwell Lab., Didcot, Oxford (UK)
OSTI ID:
6065319
Report Number(s):
CONF-880730-
Conference Information:
Journal Name: IEEE Trans. Nucl. Sci.; (United States) Journal Volume: 35:6
Country of Publication:
United States
Language:
English

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