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Observation and prediction of SEU in Hitachi SRAMs in low altitude polar orbits

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:6839981
; ;  [1];  [2];  [3]
  1. European Space Agency/ESTEC, Noordwijk (Netherlands)
  2. Univ. of Surrey, Guildford (United Kingdom). Surrey Satellite Technology
  3. Technische Univ. Braunschweig (Germany). Institut fuer Datenverarbeitungsanlagen
In-orbit SEU data from three microsatellites are separated into Galactic Cosmic Ray (GCR), South Atlantic Anomaly (SAA) and solar flare upsets. Heavy ion and proton testing of the same devices are reported and predictions using LET-dependent ion cross sections and a 2-parameter fit to proton cross section data are compared with in-flight data. SEU trends in memory devices from a single manufacturer, from 16 K-bit to 4 M-bit, are identified.
OSTI ID:
6839981
Report Number(s):
CONF-930704--
Conference Information:
Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 40:6Pt1
Country of Publication:
United States
Language:
English

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