Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

SEE flight data from Japanese satellites

Journal Article · · IEEE Transactions on Nuclear Science
DOI:https://doi.org/10.1109/23.736527· OSTI ID:323954
; ;  [1]
  1. National Space Development Agency of Japan, Sengen, Tsukuba (Japan)

This paper reviews the SEE (Single Event Effects) which have been observed on Japanese spacecraft in space since 1971, and summarizes the in-orbit SEL (Single Event Latchup) and SEU (Single Event Upset) data for 10 years from 4 Japanese satellites. The data is separated into solar maximum and solar minimum periods and into Galactic Cosmic Ray (GCR) and South Atlantic Anomaly (SAA) groupings. Heavy ion and proton testing of the same flight parts are reported. Prediction rates using CREME9f6 codes with heavy ion LET cross sections and 2-parameter fits and CREME96 to proton cross section data are compared with the SEE flight data. The authors have followed the suggestions of Petersen for a good comparison paper. The extreme value theory is applied for the prediction of the maximum SEE rates from solar flare events and can be used to discriminate the effects of the solar events from a quiescent environment, and can also be used to examine outlier data points.

OSTI ID:
323954
Report Number(s):
CONF-980705--
Journal Information:
IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6Pt1 Vol. 45; ISSN 0018-9499; ISSN IETNAE
Country of Publication:
United States
Language:
English

Similar Records

Observation and prediction of SEU in Hitachi SRAMs in low altitude polar orbits
Conference · Tue Nov 30 23:00:00 EST 1993 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) · OSTI ID:6839981

Extensions of the burst generation rate method for wider application to proton/neutron-induced single event effects
Journal Article · Mon Nov 30 23:00:00 EST 1998 · IEEE Transactions on Nuclear Science · OSTI ID:323973

Single-event effects in resolver-to-digital converters
Journal Article · Tue Nov 30 23:00:00 EST 1999 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers) · OSTI ID:20014698