Implications of angle of incidence in SEU testing of modern circuits
- Clemson Univ., SC (United States). Dept. of Physics and Astronomy
Simulations show that ignoring the angular dependence of proton SEU cross sections produces errors in predictions of SEU rates in space. Moreover, they suggest that devices with thin sensitive volumes may upset to protons at grazing incidence despite high threshold LET values (> 80 MeV cm[sup 2]) at normal incidence. Incorporating angular effects in space predictions requires accurate knowledge of the dimensions of the sensitive volume associated with the SEU-sensitive junction, especially the thickness. A method is proposed for using proton SEU measurements at different angles and energies combined with simulations to determine the thickness of the sensitive volume and to test the reliability of the predictions.
- OSTI ID:
- 6450409
- Report Number(s):
- CONF-940726--
- Journal Information:
- IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 41:6Pt1; ISSN 0018-9499; ISSN IETNAE
- Country of Publication:
- United States
- Language:
- English
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