Implications of angle of incidence in SEU testing of modern circuits

Conference · Thu Dec 01 04:00:00 EST 1994 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6450409

Reed, R A; McNulty, P J; Abdel-Kadar, W G ^[1]

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1. Clemson Univ., SC (United States). Dept. of Physics and Astronomy

Simulations show that ignoring the angular dependence of proton SEU cross sections produces errors in predictions of SEU rates in space. Moreover, they suggest that devices with thin sensitive volumes may upset to protons at grazing incidence despite high threshold LET values (> 80 MeV cm[sup 2]) at normal incidence. Incorporating angular effects in space predictions requires accurate knowledge of the dimensions of the sensitive volume associated with the SEU-sensitive junction, especially the thickness. A method is proposed for using proton SEU measurements at different angles and energies combined with simulations to determine the thickness of the sensitive volume and to test the reliability of the predictions.

• OSTI ID: 6450409
• Report Number(s): CONF-940726--
• Conference Information: Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 41:6Pt1
• Country of Publication: United States
• Language: English

Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COMPUTERIZED SIMULATION
ELECTRONIC CIRCUITS
ENERGY DEPOSITION
INCIDENCE ANGLE
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
SIMULATION
SPACE FLIGHT