Basic mechanisms of radiation effects in electronic materials and devices. Final report, September 1986-September 1987

Technical Report · Tue Sep 01 04:00:00 EDT 1987

OSTI ID:5646360

McLean, F B; Oldham, T R

This report reviews the primary physical processes underlying the response of electronic materials and devices to radiation as well as the relationship of these processes to the modes of circuit degradation and failure. An overview presents brief discussions of the major radiation environments of practical interest, the interaction of radiation with solid targets, common terminology of radiation exposure, and the primary radiation effects in electronic materials, including ionization effects (radiation-induced photocurrents and space charge buildup) and atomic displacement damage effects. An emphasis is given to the problem of total-dose ionization response, primarily in metal-oxide-semiconductor (MOS) systems. In particular, a description of the basic physical phenomena underlying the complex time history of the MOS radiation response is given, and some implications of the time-dependent response for issues of radiation testing, hardness assurance, and radiation-response prediction are pointed out. There is also discussion on the implications of scaling down the gate oxide thickness and on the increasingly important problem of radiation-induced leakage currents.

• Research Organization: Harry Diamond Labs., Adelphi, MD (USA)
• OSTI ID: 5646360
• Report Number(s): AD-A-186936/1/XAB; HDL-TR-2129
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360605 -- Materials-- Radiation Effects
42 ENGINEERING
420800* -- Engineering-- Electronic Circuits & Devices-- (-1989)
CHALCOGENIDES
CURRENTS
DAMAGE
DIMENSIONS
DOCUMENT TYPES
ELECTRONIC EQUIPMENT
EQUIPMENT
IONIZATION
MATERIALS
MICROELECTRONICS
NUCLEAR WEAPONS
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
PHYSICAL RADIATION EFFECTS
PROGRESS REPORT
RADIATION EFFECTS
SEMICONDUCTOR DEVICES
SOLIDS
SPACE CHARGE
TARGETS
THICKNESS
TIME DEPENDENCE
WEAPONS