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Dependence of crystalline orientation on film thickness in laser-ablated YBa sub 2 Cu sub 3 O sub 7 minus. delta. on LaAlO sub 3

Journal Article · · Applied Physics Letters; (USA)
DOI:https://doi.org/10.1063/1.104491· OSTI ID:5638331
 [1]; ;  [2]
  1. Center for Micro-Engineered Ceramics and Department of Chemical and Nuclear Engineering, University of New Mexico, Albuquerque, New Mexico 87131 (US)
  2. Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (USA)

The microstructure of YBa{sub 2}Cu{sub 3}O{sub 7{minus}}{sub {delta}} thin films deposited on (001)LaAlO{sub 3} substrates by a laser ablation process has been investigated by scanning electron microscopy, x-ray diffraction, and cross-sectional transmission electron microscopy. Adjacent to the substrate, the film is entirely oriented with the {ital c}-axis perpendicular to the surface. At a thickness of about 0.4 {mu}m, the occurrence of 90{degree} boundaries brings about a transition to grains with their {ital c}-axes parallel to the surface (aligned along the (100) and (010) directions of the pseudocubic LaAlO{sub 3} substrate). This transition is discussed in terms of the crystal growth anisotropy and the retained strain that may precipitate the transition.

OSTI ID:
5638331
Journal Information:
Applied Physics Letters; (USA), Journal Name: Applied Physics Letters; (USA) Vol. 58:8; ISSN APPLA; ISSN 0003-6951
Country of Publication:
United States
Language:
English