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A TEM study of microstructures of YBa sub 2 Cu sub 3 O sub 7 minus sub x thin films deposited on LaAlO sub 3 by laser ablation

Journal Article · · Journal of Materials Research; (United States)
 [1];  [2];  [3]
  1. Department of Manufacturing Engineering, Boston University, Boston, Massachusetts (USA)
  2. Department of Materials Science and Engineering, Pennsylvania State University, University Park, Pennsylvania (USA)
  3. Center for Materials Science, Los Alamos National Laboratory, Los Alamos, New Mexico (USA)

The microstructures of YBa{sub 2}Cu{sub 3}O{sub 7{minus}}{sub {ital x}} thin films deposited by laser ablation on single crystal (001) LaAlO{sub 3} substrates have been investigated. The orientation of the YBa{sub 2}Cu{sub 3}O{sub 7{minus}}{sub {ital x}} layer next to the interface is found to be completely {ital c}-perpendicular, with a high degree of epitaxy between the film and the substrate. Misfit dislocations, with a periodic spacing of around 13 nm, are present at the interface. Two distinct interfacial structures are seen in these films. At a film thickness of around 400 nm, nucleation of {ital c}-parallel grains occurs, leading to a switchover from a {ital c}-perpendicular to a {ital c}-parallel microstructure. Amorphous particulates, ejected from the target during processing, lead to the formation of misoriented grains, giving rise to high-angle grain boundaries in the film.

OSTI ID:
5236984
Journal Information:
Journal of Materials Research; (United States), Journal Name: Journal of Materials Research; (United States) Vol. 6:9; ISSN JMREE; ISSN 0884-2914
Country of Publication:
United States
Language:
English