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Method of forming semiconducting amorphous silicon films from the thermal decomposition of fluorohydridodisilanes

Patent ·
OSTI ID:5636099
This patent describes a method of forming an amorphous silicon-containing film on a substrate. The method comprises: the step of decomposing a vapor phase consisting essentially of a fluorohydridodisilane or mixture of fluorohydridodisilanes, wherein the fluorohydridodisilane is represented by the formula Si{sub 2}F{sub {ital x}}H{sub 6{minus}{ital x}} wherein x is an integer from 1 to 5, at a temperature sufficient to cause the thermal decomposition of the fluorohydridodisilane or mixture of fluorohydridodisilanes in a reaction chamber which contains, or is connected to a chamber containing, a substrate which is thermally and chemically stable at the decomposition temperature in the atmosphere of the reaction chamber, whereby the film is formed on the substrate.
Assignee:
Dow Corning Corp., Midland, TX (USA)
Patent Number(s):
US 4762808; A
Application Number:
PPN: US 7-064641A
OSTI ID:
5636099
Country of Publication:
United States
Language:
English